Electronic File Wrappers | Electronic Patent Documents | Paper Patent Documents | Current as of: June, 1999
| and Services |
DF | CLASS NOTES | |
300 | DF | PARTICLE PRECESSION RESONANCE |
301 | DF | .~ Using a magnetometer |
302 | DF | .~.~ To determine direction |
303 | DF | .~ Using well logging device |
304 | DF | .~ Using optical pumping or sensing device |
305 | DF | .~.~ Having particular optical cell structure |
306 | DF | .~ Determine fluid flow rate |
307 | DF | .~ Using a nuclear resonance spectrometer system |
308 | DF | .~.~ Including a test sample and control sample |
309 | DF | .~.~ To obtain localized resonance within a sample |
310 | DF | .~.~ By scanning sample frequency spectrum |
311 | DF | .~.~ With signal decoupling |
312 | DF | .~.~ By spectrum storage and analysis |
313 | DF | .~.~ Including polarizing magnetic field/radio frequency tuning |
314 | DF | .~.~ With conditioning of transmitter signal |
315 | DF | .~.~ With sample resonant frequency and temperature interdependence |
316 | DF | .~ Using an electron resonance spectrometer system |
317 | DF | .~.~ Including a test sample and control sample |
318 | DF | .~ Spectrometer components |
319 | DF | .~.~ Polarizing field magnet |
320 | DF | .~.~.~ With homogeneity control |
321 | DF | .~.~ Sample holder structure |
322 | DF | .~.~ Electronic circuit elements |
323 | DF | OF GEOPHYSICAL SURFACE OR SUBSURFACE IN SITU |
324 | DF | .~ Including borehole fluid investigation |
325 | DF | .~.~ To determine fluid entry |
326 | DF | .~ For small object detection or location |
327 | DF | .~.~ Using oscillator coupled search head |
328 | DF | .~.~.~ Of the beat frequency type |
329 | DF | .~.~ Using movable transmitter and receiver |
330 | DF | .~ By aerial survey |
331 | DF | .~.~ For magnetic field detection |
332 | DF | .~ With radiant energy or nonconductive-type transmitter |
333 | DF | .~.~ Within a borehole |
334 | DF | .~.~ With separate pickup |
335 | DF | .~.~.~ Employing multiple frequencies |
336 | DF | .~.~.~ To detect transient signals |
337 | DF | .~.~.~ To detect return wave signals |
338 | DF | .~.~.~ Within a borehole |
339 | DF | .~.~.~.~ By induction logging |
340 | DF | .~.~.~.~.~ To measure susceptibility |
341 | DF | .~.~.~.~.~ To measure dielectric constant |
342 | DF | .~.~.~.~.~ Using a toroidal coil |
343 | DF | .~.~.~.~.~ Using angularly spaced coils |
344 | DF | .~ With radiant energy or nonconductive-type receiver |
345 | DF | .~ By magnetic means |
346 | DF | .~.~ Within a borehole |
347 | DF | .~ Using electrode arrays, circuits, structure, or supports |
348 | DF | .~.~ For detecting naturally occurring fields, currents, or potentials |
349 | DF | .~.~.~ Of the telluric type |
350 | DF | .~.~.~.~ Including magneto-telluric type |
351 | DF | .~.~.~ Within a borehole |
352 | DF | .~.~.~.~ Combined with artificial source measurement |
353 | DF | .~.~.~.~ With fluid movement or pressure variation |
354 | DF | .~.~ Coupled to artificial current source |
355 | DF | .~.~.~ Within a borehole |
356 | DF | .~.~.~.~ While drilling |
357 | DF | .~.~.~ Including separate pickup of generated fields or potentials |
358 | DF | .~.~.~.~ With three electrodes |
359 | DF | .~.~.~.~ With nonelectrode pickup means |
360 | DF | .~.~.~.~ Using a pulse-type current source |
361 | DF | .~.~.~.~.~ With mechanical current reversing means |
362 | DF | .~.~.~.~.~ To measure induced polarization |
363 | DF | .~.~.~.~ By varying the path of current flow |
364 | DF | .~.~.~.~.~ Using frequency variation |
365 | DF | .~.~.~.~ Offshore |
366 | DF | .~.~.~.~ For well logging |
367 | DF | .~.~.~.~.~ Using a pad member |
368 | DF | .~.~.~.~.~ Cased borehole |
369 | DF | .~.~.~.~.~ While drilling |
370 | DF | .~.~.~.~.~ Using surface current electrodes |
371 | DF | .~.~.~.~.~ Using plural fields |
372 | DF | .~.~.~.~.~ Between spaced boreholes |
373 | DF | .~.~.~.~.~ Using current focussing means |
374 | DF | .~.~.~.~.~.~ Including a pad member |
375 | DF | .~.~.~.~.~.~ Including plural current focussing arrays |
376 | DF | OF SUBSURFACE CORE SAMPLE |
377 | DF | .~ For magnetic properties |
378 | DF | INTERNAL-COMBUSTION ENGINE IGNITION SYSTEM OR DEVICE |
379 | DF | .~ With analysis of displayed waveform |
380 | DF | .~ Electronic ignition system |
381 | DF | .~.~ With magnetically controlled circuit |
382 | DF | .~.~ With capacitor discharge circuit |
383 | DF | .~ By simulating or substituting for a component under test |
384 | DF | .~ Using plural tests in a conventional ignition system |
385 | DF | .~ Distributor |
386 | DF | .~.~ Dwell (i.e., cam angle) |
387 | DF | .~.~ Condenser |
388 | DF | .~ Coil |
389 | DF | .~ Magneto |
390 | DF | .~ Low or high tension lead |
391 | DF | .~ Ignition timing |
392 | DF | .~.~ Using a pulse signal technique |
393 | DF | .~ In situ testing of spark plug |
394 | DF | .~.~ With cathode-ray tube display |
395 | DF | .~.~ Using an illuminating device to indicate spark plug condition |
396 | DF | .~.~ With an air gap in series with spark plug to indicate spark plug condition |
397 | DF | .~.~ By shorting the plug to ground to indicate spark plug condition |
398 | DF | .~.~.~ With air gap in ground circuit |
399 | DF | .~.~ Wherein a measured electric quantity indicates spark plug condition |
400 | DF | .~ Spark plug removed or tested in a test fixture |
401 | DF | .~.~ Using a pressure chamber |
402 | DF | .~ Apparatus for coupling a measuring instrument to an ignition system |
403 | DF | ELECTRIC LAMP OR DISCHARGE DEVICE |
404 | DF | .~ Cathode-ray tube |
405 | DF | .~ Vacuum tube |
406 | DF | .~.~ Plural tubes in the testing circuit |
407 | DF | .~.~ Testing circuit for diverse-type tube |
408 | DF | .~.~ Circuit for making diverse test |
409 | DF | .~.~ Testing discharge space characteristic (e.g., emission) |
410 | DF | .~.~.~ With application of current or potential to the discharge control means |
411 | DF | .~.~.~.~ Pulsating or alternating current or potential for the discharge control means |
412 | DF | .~.~.~.~.~ Pulsating or alternating current for the anode |
413 | DF | .~.~ Shock testing |
414 | DF | .~ Electric lamp |
415 | DF | ELECTROMECHANICAL SWITCHING DEVICE |
416 | DF | .~ Voltage regulator |
417 | DF | .~ Thermostat switch |
418 | DF | .~ Relay |
419 | DF | .~.~ Reed switch |
420 | DF | .~.~ To evaluate contact chatter |
421 | DF | .~.~ To evaluate contact resistance |
422 | DF | .~.~ To evaluate contact sequence of operation |
423 | DF | .~.~ To evaluate contact response time |
424 | DF | .~ Circuit breaker |
425 | DF | ELECTROLYTE PROPERTIES |
426 | DF | .~ Using a battery testing device |
427 | DF | .~.~ To determine ampere-hour charge capacity |
428 | DF | .~.~.~ Including an integrating device |
429 | DF | .~.~ To determine load/no-load voltage |
430 | DF | .~.~ To determine internal battery impedance |
431 | DF | .~.~ With temperature compensation of measured condition |
432 | DF | .~.~ To determine battery electrolyte condition |
433 | DF | .~.~ To compare battery voltage with a reference voltage |
434 | DF | .~.~ To determine plural cell condition |
435 | DF | .~.~ Having particular meter scale or indicator |
436 | DF | .~.~ Including oscillator in measurement circuit |
437 | DF | .~.~ Including probe structure |
438 | DF | .~ Using a pH determining device |
439 | DF | .~ Using a conductivity determining device |
440 | DF | .~.~ Which includes a dropping mercury cell |
441 | DF | .~.~ Which includes a temperature responsive element |
442 | DF | .~.~ Which includes an oscillator |
443 | DF | .~.~ Having a bridge circuit |
444 | DF | .~.~ Which includes current and voltage electrodes |
445 | DF | .~.~ Having inductance probe structure |
446 | DF | .~.~ Having conductance probe structure |
447 | DF | .~.~.~ With movable or adjustable electrode |
448 | DF | .~.~.~ With concentric electrodes |
449 | DF | .~.~.~ With axially arranged electrodes |
450 | DF | .~.~ Which includes particular cell container structure |
451 | DF | A MATERIAL PROPERTY USING THERMOELECTRIC PHENOMENON |
452 | DF | A MATERIAL PROPERTY USING ELECTROSTATIC PHENOMENON |
453 | DF | .~ In a liquid |
454 | DF | .~ Frictionally induced |
455 | DF | .~ Corona induced |
456 | DF | .~ For flaw detection |
457 | DF | ELECTROSTATIC FIELD |
458 | DF | .~ Using modulation-type electrometer |
459 | DF | USING IONIZATION EFFECTS |
460 | DF | .~ For monitoring pressure |
461 | DF | .~.~ Using a radioactive substance |
462 | DF | .~.~ Using thermionic emissions |
463 | DF | .~.~ Using a magnetic field |
464 | DF | .~ For analysis of gas, vapor, or particles of matter |
465 | DF | .~.~ Using electronegative gas sensor |
466 | DF | .~.~ Using a filter |
467 | DF | .~.~ Using test material desorption |
468 | DF | .~.~ Using thermal ionization |
469 | DF | .~.~ Using a radioactive substance |
470 | DF | .~.~ Using thermionic emission |
200 | DF | MAGNETIC |
201 | DF | .~ Susceptibility |
202 | DF | .~ Calibration |
203 | DF | .~ Curie point determination |
204 | DF | .~ Fluid material examination |
205 | DF | .~ Permanent magnet testing |
206 | DF | .~ Movable random length material measurement |
207.11 | DF | .~ Displacement |
207.12 | DF | .~.~ Compensation for measurement |
207.13 | DF | .~.~ Having particular sensor means |
207.14 | DF | .~.~.~ Diverse sensors |
207.15 | DF | .~.~.~ Inductive |
207.16 | DF | .~.~.~.~ Electrically energized |
207.17 | DF | .~.~.~.~.~ Separate pick-up |
207.18 | DF | .~.~.~.~.~ Differential type (e.g., LVDT) |
207.19 | DF | .~.~.~.~.~ Differential bridge circuit |
207.2 | DD | .~.~.~ Hall effect |
207.21 | DF | .~.~.~ Magnetoresistive |
207.22 | DF | .~.~ Having particular sensed object |
207.23 | DF | .~.~ Plural measurements (e.g., linear and rotary) |
207.24 | DF | .~.~ Linear |
207.25 | DF | .~.~ Rotary |
207.26 | DF | .~.~ Approach or retreat |
209 | DF | .~ Stress in material measurement |
210 | DF | .~ Magnetic information storage element testing |
211 | DF | .~.~ Memory core storage element testing |
212 | DF | .~.~ Dynamic information element testing |
213 | DF | .~ Magnetic recording medium on magnetized object records object field |
214 | DF | .~ By paramagnetic particles |
215 | DF | .~.~ With pattern enhancing additive |
216 | DF | .~.~ Flaw testing |
217 | DF | .~ Railroad rail flaw testing |
218 | DF | .~.~ Rail joint cutout |
219 | DF | .~ Magnetic sensor within material |
220 | DF | .~.~ Sensor supported, positioned, or moved within pipe |
221 | DF | .~.~.~ Borehole pipe testing |
222 | DF | .~ Hysteresis or eddy current loss testing |
223 | DF | .~ Hysteresis loop curve display or recording |
224 | DF | .~ With temperature control of material or element of test circuit |
225 | DF | .~ With compensation for test variable |
226 | DF | .~ Combined |
227 | DF | .~ Plural tests |
228 | DF | .~ With means to create magnetic field to test material |
229 | DF | .~.~ Thickness measuring |
230 | DF | .~.~.~ Layer or layered material |
231 | DF | .~.~.~ With backing member |
232 | DF | .~.~ Plural magnetic fields in material |
233 | DF | .~.~ With phase sensitive element |
234 | DF | .~.~ Electrically energized nonforce type sensor |
235 | DF | .~.~.~ Noncoil type |
236 | DF | .~.~.~ Oscillator type |
237 | DF | .~.~.~.~ Material flaw testing |
238 | DF | .~.~.~ Material flaw testing |
239 | DF | .~.~ Induced voltage-type sensor |
240 | DF | .~.~.~ Material flaw testing |
241 | DF | .~.~.~.~ Opposed induced voltage sensors |
242 | DF | .~.~.~.~ Plural sensors |
243 | DF | .~.~.~ Plural sensors |
244 | DF | .~ Magnetometers |
244.1 | DF | .~.~ Optical |
245 | DF | .~.~ Plural sensor axis misalignment correction |
246 | DF | .~.~ With means to align field sensor with magnetic field sensed |
247 | DF | .~.~ Nonparallel plural magnetic sensors |
248 | DF | .~.~ Superconductive magnetometers |
249 | DF | .~.~ Thin film magnetometers |
250 | DF | .~.~ Electronic tube or microwave magnetometers |
251 | DF | .~.~ Hall plate magnetometers |
252 | DF | .~.~ Semiconductor type solid-state or magnetoresistive magnetometers |
253 | DF | .~.~ Saturable core magnetometers |
254 | DF | .~.~.~ Second harmonic type |
255 | DF | .~.~.~ Peak voltage type |
256 | DF | .~.~ Energized movable sensing coil magnetometers |
257 | DF | .~.~ Moving coil magnetometer |
258 | DF | .~.~ Fixed coil magnetometer |
259 | DF | .~.~ Movable magnet or magnetic member interacts with magnetic field |
260 | DF | .~ Magnetic field detection devices |
261 | DF | .~.~ With support for article |
262 | DF | .~ Magnetic test structure elements |
263 | DF | .~ Current through test material forms test magnetic field |
500 | DF | FAULT DETECTING IN ELECTRIC CIRCUITS AND OF ELECTRIC COMPONENTS |
501 | DF | .~ Using radiant energy |
502 | DF | .~ In an ignitor or detonator |
503 | DF | .~ In vehicle wiring |
504 | DF | .~.~ With trailer |
505 | DF | .~.~ Combined with window glass |
506 | DF | .~ Combined with a flashlight |
507 | DF | .~.~ With fuse testing attachment |
508 | DF | .~ With electric power receptacle for line wire testing |
509 | DF | .~ Of ground fault indication |
510 | DF | .~.~ Of electrically operated apparatus (power tool, appliance, machine, etc.) |
511 | DF | .~ Of electrically operated apparatus (power tool, appliance, machine, etc.) |
512 | DF | .~ For fault location |
513 | DF | .~.~ Where component moves while under test |
514 | DF | .~.~.~ By exposing component to liquid or gas while under test |
515 | DF | .~.~.~ Using a particular sensing electrode |
516 | DF | .~.~.~.~ Metal chain |
517 | DF | .~.~.~.~ Wire bristles |
518 | DF | .~.~.~.~ Metal pellets or beads |
519 | DF | .~.~ By capacitance measuring |
520 | DF | .~.~ By frequency sensitive or responsive detection |
521 | DF | .~.~ By phase sensitive or responsive detection |
522 | DF | .~.~ By voltage or current measuring |
523 | DF | .~.~.~ Of an applied test signal |
524 | DF | .~.~.~ Polarity responsive |
525 | DF | .~.~ By resistance or impedance measuring |
526 | DF | .~.~.~ Using a bridge circuit |
527 | DF | .~.~ By applying a test signal |
528 | DF | .~.~.~ Tracing test signal to fault location |
529 | DF | .~.~.~.~ Using a magnetic field sensor |
530 | DF | .~.~.~.~ Using an electric field sensor |
531 | DF | .~.~.~ At fault site |
532 | DF | .~.~.~ Using time measuring |
533 | DF | .~.~.~.~ Of reflected test signal |
534 | DF | .~.~ By reflection technique |
535 | DF | .~.~ By time measuring |
536 | DF | .~.~ By spark or arc discharge |
537 | DF | .~ Of individual circuit component or element |
750 | DF | .~.~ System sensing fields adjacent device under test (DUT) |
751 | DF | .~.~.~ Using electron beam probe |
752 | DF | .~.~.~ Using light probe |
753 | DF | .~.~.~ Using electro-optic device |
754 | DF | .~.~ With probe elements |
755 | DF | .~.~.~ Internal of or on support for device under test (DUT) |
756 | DF | .~.~.~ Contact confirmation |
757 | DF | .~.~.~ Probe contact enhancement |
758 | DF | .~.~.~ Probe alignment or positioning |
759 | DF | .~.~.~ With recording of test results on DUT |
760 | DF | .~.~.~ With temperature control |
761 | DF | .~.~.~ Pin |
762 | DF | .~.~.~ Cantilever |
763 | DF | .~.~ DUT including test circuit |
764 | DF | .~.~ With identification of DUT |
765 | DF | .~.~ Test of semiconductor device |
766 | DF | .~.~.~ With barrier layer |
767 | DF | .~.~.~.~ Diode |
768 | DF | .~.~.~.~ Bipolar transistor |
769 | DF | .~.~.~.~ Field effect transistor |
770 | DF | .~.~ Liquid crystal device test |
771 | DF | .~.~ Power supply test |
772 | DF | .~.~ Motor or generator fault tests |
538 | DF | .~.~ Electrical connectors |
539 | DF | .~.~ Multiconductor cable |
540 | DF | .~.~.~ With sequencer |
541 | DF | .~.~.~ For insulation fault |
542 | DF | .~.~.~ Having a light or sound indicator |
543 | DF | .~.~ Single conductor cable |
544 | DF | .~.~.~ For insulation fault |
545 | DF | .~.~ Armature or rotor |
546 | DF | .~.~ Winding or coil |
547 | DF | .~.~.~ Transformer |
548 | DF | .~.~ Capacitor |
549 | DF | .~.~ Resistor |
550 | DF | .~.~ Fuse |
551 | DF | .~.~ Insulation |
552 | DF | .~.~.~ Bushing |
553 | DF | .~.~.~ Oil |
554 | DF | .~.~.~ Sheet material |
555 | DF | .~ Instruments and devices for fault testing |
556 | DF | .~.~ Having a lamp or light indicator |
557 | DF | FOR INSULATION FAULT OF NONCIRCUIT ELEMENTS |
558 | DF | .~ Where element moves while under test |
559 | DF | .~ Where a moving sensing electrode scans a stationary element under test |
600 | DF | IMPEDANCE, ADMITTANCE OR OTHER QUANTITIES REPRESENTATIVE OF ELECTRICAL STIMULUS/RESPONSE RELATIONSHIPS |
601 | DF | .~ Calibration |
602 | DF | .~ With auxiliary means to condition stimulus/response signals |
603 | DF | .~.~ For excitation |
604 | DF | .~.~.~ Including marker signal generator circuit |
605 | DF | .~.~ For response signal evaluation or processing |
606 | DF | .~.~.~ Including a signal comparison circuit |
607 | DF | .~.~.~ Including a conversion (e.g., A->D or D-> A) process |
608 | DF | .~.~.~ Including a ratiometric function |
609 | DF | .~.~ For sensing |
610 | DF | .~.~.~ Including a bridge circuit |
611 | DF | .~.~.~ Including a remote type circuit |
612 | DF | .~ Parameter related to the reproduction or fidelity of a signal affected by a circuit under test |
613 | DF | .~.~ Noise |
614 | DF | .~.~.~ Signal to noise ratio or noise figure |
615 | DF | .~.~ Transfer function type characteristics |
616 | DF | .~.~.~ Gain or attenuation |
617 | DF | .~.~.~ Response time or phase delay |
618 | DF | .~.~.~ Transient response or transient recovery time (e.g., damping) |
619 | DF | .~.~.~ Selective type characteristics |
620 | DF | .~.~ Distortion |
621 | DF | .~.~.~ Envelope delay |
622 | DF | .~.~.~ Phase |
623 | DF | .~.~.~ Harmonic |
624 | DF | .~.~.~ Intermodulation |
625 | DF | .~.~.~ Dissymmetry or asymmetry |
626 | DF | .~.~.~ Nonlinearity |
627 | DF | .~.~ Shielding effectiveness (SE) |
628 | DF | .~.~.~ Circuit interference (e.g., crosstalk) measurement |
629 | DF | .~ Distributive type parameters |
630 | DF | .~.~ Plural diverse parameters |
631 | DF | .~.~ Using wave polarization (e.g., field rotation) |
632 | DF | .~.~ Using particular field coupling type (e.g., fringing field) |
633 | DF | .~.~ Using resonant frequency |
634 | DF | .~.~.~ To determine water content |
635 | DF | .~.~.~ To determine dimension (e.g., distance or thickness) |
636 | DF | .~.~.~ With a resonant cavity |
637 | DF | .~.~ Using transmitted or reflected microwaves |
638 | DF | .~.~.~ Scattering type parameters (e.g., complex reflection coefficient) |
639 | DF | .~.~.~ Where energy is transmitted through a test substance |
640 | DF | .~.~.~.~ To determine water content |
641 | DF | .~.~.~.~ To determine insertion loss |
642 | DF | .~.~.~ Where energy is reflected (e.g., reflectometry) |
643 | DF | .~.~.~.~ To determine water content |
644 | DF | .~.~.~.~ To determine dimension (e.g., distance or thickness) |
645 | DF | .~.~.~.~ Having standing wave pattern |
646 | DF | .~.~.~.~ To determine reflection coefficient |
647 | DF | .~.~ Using a comparison or difference circuit |
648 | DF | .~.~.~ With a bridge circuit |
649 | DF | .~ Lumped type parameters |
650 | DF | .~.~ Using phasor or vector analysis |
651 | DF | .~.~.~ With a bridge circuit |
652 | DF | .~.~ Of a resonant circuit |
653 | DF | .~.~ For figure of merit or Q value |
654 | DF | .~.~ Using inductive type measurement |
655 | DF | .~.~.~ Including a tuned or resonant circuit |
656 | DF | .~.~.~ Including a comparison or difference circuit |
657 | DF | .~.~.~.~ Using a bridge circuit |
658 | DF | .~.~ Using capacitive type measurement |
659 | DF | .~.~.~ With loss characteristic evaluation |
660 | DF | .~.~.~ With variable electrode area |
661 | DF | .~.~.~ With variable distance between capacitor electrodes |
662 | DF | .~.~.~.~ To determine dimension (e.g., thickness or distance) |
663 | DF | .~.~.~ Where a material or object forms part of the dielectric being measured |
664 | DF | .~.~.~.~ To determine water content |
665 | DF | .~.~.~.~.~ By comparison or difference circuit |
666 | DF | .~.~.~.~.~.~ Including a bridge circuit |
667 | DF | .~.~.~.~.~ By frequency signal response, change or processing circuit |
668 | DF | .~.~.~.~.~.~ Including a tuned or resonant circuit |
669 | DF | .~.~.~.~.~ With compensation means |
670 | DF | .~.~.~.~.~.~ For temperature variations |
671 | DF | .~.~.~.~ To determine dimension (e.g., dielectric thickness) |
672 | DF | .~.~.~.~ By comparison or difference circuit |
673 | DF | .~.~.~.~.~ Including a bridge circuit |
674 | DF | .~.~.~.~ By frequency signal response, change or processing circuit |
675 | DF | .~.~.~.~.~ Including a tuned or resonant circuit |
676 | DF | .~.~.~ With pulse signal processing circuit |
677 | DF | .~.~.~.~ Including R/C time constant circuit |
678 | DF | .~.~.~.~ Including charge or discharge cycle circuit |
679 | DF | .~.~.~ With comparison or difference circuit |
680 | DF | .~.~.~.~ Including a bridge circuit |
681 | DF | .~.~.~ With frequency signal response, change or processing circuit |
682 | DF | .~.~.~.~ Including a tuned or resonant circuit |
683 | DF | .~.~.~ With phase signal processing circuit |
684 | DF | .~.~.~ With compensation means |
685 | DF | .~.~.~.~ For temperature variation |
686 | DF | .~.~.~ With a capacitive sensing means |
687 | DF | .~.~.~.~ Having fringing field coupling |
688 | DF | .~.~.~.~ Including a guard or ground electrode |
689 | DF | .~.~.~.~ To determine water content |
690 | DF | .~.~.~.~ Including a probe type structure |
691 | DF | .~.~ Using resistance or conductance measurement |
692 | DF | .~.~.~ With living organism condition determination using conductivity effects |
693 | DF | .~.~.~ With object or substance characteristic determination using conductivity effects |
694 | DF | .~.~.~.~ To determine water content |
695 | DF | .~.~.~.~.~ Where the object moves while under test |
696 | DF | .~.~.~.~.~ With a probe structure |
697 | DF | .~.~.~.~ For interface |
698 | DF | .~.~.~.~ To determine oil qualities |
699 | DF | .~.~.~.~ To determine dimension (e.g., distance or thickness) |
700 | DF | .~.~.~.~.~ Including corrosion or erosion |
701 | DF | .~.~.~.~ Where the object moves while under test |
702 | DF | .~.~.~ With radiant energy effects |
703 | DF | .~.~.~.~ Including heating |
704 | DF | .~.~.~ With ratio determination |
705 | DF | .~.~.~ With comparison or difference circuit |
706 | DF | .~.~.~.~ Including a bridge circuit |
707 | DF | .~.~.~ With frequency response, change or processing circuit |
708 | DF | .~.~.~.~ Including a tuned or resonant circuit |
709 | DF | .~.~.~ With phase signal processing circuit |
710 | DF | .~.~.~ With pulse signal processing circuit |
711 | DF | .~.~.~.~ Including R/C time constant circuit |
712 | DF | .~.~.~.~ Including a digital or logic circuit |
713 | DF | .~.~.~ With voltage or current signal evaluation |
714 | DF | .~.~.~.~ Including a potentiometer |
715 | DF | .~.~.~.~ Including a particular probing technique (e.g., four point probe) |
716 | DF | .~.~.~.~.~ To determine dimension (e.g., distance or thickness) |
717 | DF | .~.~.~.~.~ To determine material composition |
718 | DF | .~.~.~.~.~ To detect a flaw or defect |
719 | DF | .~.~.~ With semiconductor or IC materials quality determination using conductivity effects |
720 | DF | .~.~.~ With compensation means |
721 | DF | .~.~.~.~ For temperature variation |
722 | DF | .~.~.~ Device or apparatus determines conductivity effects |
723 | DF | .~.~.~.~ Potentiometer |
724 | DF | .~.~.~.~ Using a probe type structure |
725 | DF | .~ Using a particular bridge circuit |
726 | DF | .~ Transformer testing (e.g., ratio) |
727 | DF | .~ Piezoelectric crystal testing (e.g., frequency, resistance) |
66 | DF | CONDUCTOR IDENTIFICATION OR LOCATION (E.G., PHASE IDENTIFICATION) |
67 | DF | .~ Inaccessible (at test point) conductor (e.g., buried in wall) |
160 | DF | ELECTRICAL SPEED MEASURING |
161 | DF | .~ Speed comparing means |
162 | DF | .~ With acceleration measuring means |
163 | DF | .~ Including speed analog electrical signal generator |
164 | DF | .~.~ Eddy current generator type (e.g., tachometer) |
165 | DF | .~.~ With direction indicator |
166 | DF | .~ Including speed-related frequency generator |
167 | DF | .~.~ Including rotating magnetic field actuated indicator |
168 | DF | .~.~ Including periodic switch |
169 | DF | .~.~.~ In ignition system |
170 | DF | .~.~.~.~ High voltage speed signal type |
171 | DF | .~.~.~ With extent-of-travel indicator |
172 | DF | .~.~ Including synchronized recording medium |
173 | DF | .~.~ Including magnetic detector |
174 | DF | .~.~.~ Permanent magnet type |
175 | DF | .~.~ Including radiant energy detector |
176 | DF | .~ Including object displacement varied variable circuit impedance |
177 | DF | .~ Including motor current or voltage sensor |
178 | DF | .~ Including "event" sensing means |
179 | DF | .~.~ Magnetic field sensor |
180 | DF | .~.~ Mechanically actuated switch |
71.1 | DF | DETERMINING NONELECTRIC PROPERTIES BY MEASURING ELECTRIC PROPERTIES |
71.2 | DF | .~ Erosion |
71.3 | DF | .~ Beam of atomic particles |
71.4 | DF | .~ Particle counting |
71.5 | DF | .~ Semiconductors for nonelectrical property |
71.6 | DF | .~ Superconductors |
72 | DF | TESTING POTENTIAL IN SPECIFIC ENVIRONMENT (E.G., LIGHTNING STROKE) |
72.5 | DF | .~ Voltage probe |
73.1 | DF | PLURAL, AUTOMATICALLY SEQUENTIAL TESTS |
74 | DF | TESTING AND CALIBRATING ELECTRIC METERS (E.G., WATT-HOUR METERS) |
75 | DF | .~ By stroboscopic means |
76.11 | DF | MEASURING, TESTING, OR SENSING ELECTRICITY, PER SE |
76.12 | DF | .~ Analysis of complex waves |
76.13 | DF | .~.~ Amplitude distribution |
76.14 | DF | .~.~.~ Radiometer (e.g., microwave, etc.) |
76.15 | DF | .~.~.~ With sampler |
76.16 | DF | .~.~.~ With counter |
76.17 | DF | .~.~.~ With integrator |
76.18 | DF | .~.~.~ With slope detector |
76.19 | DF | .~.~ Frequency spectrum analyzer |
76.21 | DF | .~.~.~ By Fourier analysis |
76.22 | DF | .~.~.~ Real-time spectrum analyzer |
76.23 | DF | .~.~.~ With mixer |
76.24 | DF | .~.~.~ With sampler |
76.25 | DF | .~.~.~ With slope detector |
76.26 | DF | .~.~.~ Scanning-panoramic receiver |
76.27 | DF | .~.~.~.~ With particular sweep circuit |
77.11 | DF | .~.~.~ Nonscanning |
76.28 | DF | .~.~.~.~ Digital filter |
76.29 | DF | .~.~.~.~ With filtering |
76.31 | DF | .~.~.~.~.~ Parallel filters |
76.32 | DF | .~.~.~.~.~.~ With space discharge device |
76.33 | DF | .~.~.~.~ Correlation |
76.34 | DF | .~.~.~.~.~ With space discharge device |
76.35 | DF | .~.~.~.~ With delay line |
76.36 | DF | .~.~.~.~ With optics |
76.37 | DF | .~.~.~.~.~ Bragg cell |
76.38 | DF | .~.~ With sampler |
76.39 | DF | .~ Frequency of cyclic current or voltage (e.g., cyclic counting etc.) |
76.41 | DF | .~.~ Frequency comparison, (e.g., heterodyne, etc.) |
76.42 | DF | .~.~.~ With sampler |
76.43 | DF | .~.~.~ With plural mixers |
76.44 | DF | .~.~.~ With filtering |
76.45 | DF | .~.~.~.~ Bandpass |
76.46 | DF | .~.~.~.~ Plural |
76.47 | DF | .~.~.~ Digital output |
76.48 | DF | .~.~.~.~ With counter |
76.49 | DF | .~.~ Tuned mechanical resonator (e.g., reed, piezocrystal, etc.) |
76.51 | DF | .~.~ By tuning (e.g., to resonance,etc.) |
76.52 | DF | .~.~ By phase comparison |
76.53 | DF | .~.~.~ With phase lock |
76.54 | DF | .~.~.~ With delay line |
76.55 | DF | .~.~.~ Digital output |
76.56 | DF | .~.~.~.~ With microwave frequency detection |
76.57 | DF | .~.~.~.~ With tone detection |
76.58 | DF | .~.~.~.~ With sampler |
76.59 | DF | .~.~.~.~ With multiplexing |
76.61 | DF | .~.~.~.~ With memory |
76.62 | DF | .~.~.~.~ With counter |
76.63 | DF | .~.~.~.~.~ Using register |
76.64 | DF | .~.~.~.~.~ Plural |
76.65 | DF | .~.~.~.~ With space discharge device |
76.66 | DF | .~.~.~ With capacitive energy storage |
76.67 | DF | .~.~.~.~ With space discharge device |
76.68 | DF | .~.~.~ With filtering |
76.69 | DF | .~.~.~ Current output proportional to frequency |
76.71 | DF | .~.~.~ Nulling circuit |
76.72 | DF | .~.~.~ Qualitative output |
76.73 | DF | .~.~.~ With saturable device |
76.74 | DF | .~.~.~ Deviation measurement |
76.75 | DF | .~.~ Having inductive sensing |
76.76 | DF | .~.~ With space discharge device |
76.77 | DF | .~ Phase comparison (e.g., between cyclic pulse voltage and sinusoidal current, etc.) |
76.78 | DF | .~.~ Quadrature sensing |
76.79 | DF | .~.~ Feedback control, electrical |
76.81 | DF | .~.~ Feedback control, mechanical |
76.82 | DF | .~.~ Digital output |
76.83 | DF | .~.~ Analog output |
84 | DF | .~.~ With waveguide (e.g., coaxial cable) |
85 | DF | .~.~ With frequency conversion |
86 | DF | .~.~ Polyphase (e.g., phase angle, phase rotation or sequence) |
87 | DF | .~.~ With nonlinear device (e.g., saturable reactor, rectifier), discharge device (e.g., gas tube) or lamp |
88 | DF | .~.~.~ Cathode ray |
89 | DF | .~.~.~ Space discharge control means (e.g., grid) |
90 | DF | .~.~ Electrodynamometer instrument |
91 | DF | .~.~ Synchroscope type |
92 | DF | .~ Fluid (e.g., thermal expansion) |
93 | DF | .~.~ Conductive field (e.g., mercury) |
94 | DF | .~.~.~ Electrolytic |
95 | DF | .~ With waveguide or long line |
96 | DF | .~ Using radiant energy |
97 | DF | .~.~ Light beam type (e.g., mirror galvanometer, parallax-free scale) |
98 | DF | .~ Balancing (e.g., known/unknown voltage comparison, bridge, rebalancing) |
99 R | DF | .~.~ Automatic |
100 | DF | .~.~.~ With recording |
99 D | DF | .~.~.~ Digital voltmeters |
101 | DF | .~ Non-rebalancing bridge |
102 | DF | .~ Transient or portion of cyclic |
103 R | DF | .~ Demand, excess, maximum or minimum (e.g., separate meters for positive and negative power, peak voltmeter) |
104 | DF | .~.~ Thermal (e.g., actuation) |
103 P | DF | .~.~ Peak voltmeters |
105 | DF | .~ Thermal (e.g., compensation) |
106 | DF | .~.~ Actuation |
107 | DF | .~ Polyphase |
108 | DF | .~.~ Positive, negative or zero sequence |
109 | DF | .~ Electrostatic attraction or piezoelectric |
110 | DF | .~ Meter protection or fraud combatting |
111 | DF | .~ With storage means for voltage or current (e.g., condenser banks) |
112 | DF | .~.~ Tape, sheet (e.g., disk) or wire (e.g., magnetic) storage |
113 | DF | .~ Recording |
114 | DF | .~ Plural meters (e.g., plural movements in one case) |
115 | DF | .~ Plural ranges, scales or registration rates |
116 | DF | .~.~ With register (e.g., discount type, demand penalty) |
117 R | DF | .~ Magnetic saturation (e.g., in field or in amplifier) |
117 H | DF | .~.~ Hall effect |
118 | DF | .~ Modulator/demodulator |
119 | DF | .~ With rectifier (e.g., A.C. to D.C.) |
120 | DF | .~ With voltage or current conversion (e.g., D.C. to A.C., 60 to 1000) |
121 R | DF | .~ Cathode ray (e.g., magic eye) |
121 E | DF | .~.~ Magic eye indicators |
122 | DF | .~ Gaseous discharge (e.g., spark gap voltmeter) |
123 R | DF | .~ With amplifier or space discharge device |
124 | DF | .~.~ Inverted amplifier |
123 C | DF | .~.~ Feedback amplifiers |
125 | DF | .~ Inertia control, instrument damping and vibration damping |
126 | DF | .~ With coupling means (e.g., attenuator, shunt) |
127 | DF | .~.~ Transformer (e.g., split core admits conductor carrying unknown current) |
128 | DF | .~.~ Selective filter |
129 | DF | .~ Polepiece (e.g., split) admits nonunitary input conductor |
130 | DF | .~ Self-calibration |
131 | DF | .~ Suppressed zero |
132 | DF | .~ Nonlinear (e.g., Thyrite) |
133 | DF | .~ Nonquantitative (e.g., hot-line indicator, polarity tester) |
134 | DF | .~ With commutator or reversing or pulsating switch (e.g., D.C. watt-hour meter) |
135 | DF | .~.~ Oscillating |
136 | DF | .~ With rolling wheel or ball (e.g., transmission, integrating) |
137 | DF | .~ Eddy current rotor (e.g., A.C. integrating wattmeter) |
138 | DF | .~.~ With phase adjustment |
139 | DF | .~ Motor-driven, time-controlled or oscillating (e.g., ratchet) |
140 R | DF | .~ Plural inputs (e.g., summation, ratio) |
141 | DF | .~.~ Voltamperes (real or reactive) |
142 | DF | .~.~ Watts |
140 D | DF | .~.~ Ratio |
143 | DF | .~ Plural active motor elements (e.g., for two crossed pointers) |
144 | DF | .~ With electromagnetic field (e.g., dynamometer) |
145 | DF | .~.~ Solenoid plunger type |
146 | DF | .~.~ With permanent magnet (e.g., field, vane) |
147 | DF | .~.~ Soft iron vane |
149 | DF | .~ With probe, prod or terminals |
150 | DF | .~ Eccentrically pivoted coil |
151 R | DF | .~ With permanent magnet |
152 | DF | .~.~ Drag magnet |
151 A | DF | .~.~ Permanent magnet core |
153 | DF | .~ With register |
154 R | DF | .~ With rotor (e.g., filar suspension, zero set, balancing) |
155 | DF | .~.~ With pivot (e.g., internal friction compensation, anticreep) |
154 PB | DF | .~.~ Pointer and bearing details |
156 | DF | .~ Casings |
157 | DF | .~ Combined |
158.1 | DF | MISCELLANEOUS |
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CROSS-REFERENCE ART COLLECTION | ||
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800 | DF | DIVINING RODS |