(under the class definition) Subject matter for measuring or determining two or more electrical characteristics of an electrical circuit or circuit element, or for measuring or determining a single electrical characteristic of two or more electrical circuits or circuit elements, wherein the measurements or determinations are made one after another without human intervention.
(1) Note. This subclass is the residual locus of processes and apparatus which automatically perform sequential tests of the Class 324 type, none of which tests are provided for by subclasses preceding this one in the Class 324 schedule. Similar processes and apparatus in which one of the plural tests is provided for in a preceding subclass will be found in that subclass. For example, a patent claiming means for automatically testing a circuit for an "open circuit" caused by the failure of a circuit element, followed automatically by a test to determine the input/output characteristics of the circuit is classifiable as an "original" in subclasses 500+.
(2) Note. This subclass is the locus of processes and apparatus for performing, in automatic sequence, two or more Class 324 type tests which otherwise may be provided for in subclasses following this one in the Class 324 schedule. For example, a patent claiming a testing apparatus consisting of a combination of means to determine frequency, means to compare phase, and means to permit a human operator to switch from one means to another is classifiable as an "original" in subclasses 78+.
(3) Note. Subject matter for performing plural, Class 324 type tests simultaneously but not sequentially will be found in subclasses determined by the tests, per se.
(4) Note. Electrical characteristics measured by the subject matter of this subclass type include the response of a circuit or circuit element to a particular electrical input and includes such tests to determine the existence of miswired circuits. For similar subject matter used to detect the presence of short or open circuits caused by failures in circuit elements or their interconnections, see the reference below to subclasses 500+ in the search notes to other subclasses in this class.
(5) Note. The measurements of this subclass type may result in either quantitative or qualitative ("go-no-go") indications.
(6) Note. The automatic, sequential measurement of the analog responses of a circuit or circuit element to two different input levels is classifiable in this subclass. The response of a circuit or circuit element to a pattern of high and low digital input signals is classifiable in Class 371. (7) Note. Testing means of this subclass type produce a distinct indication for each of the plural tests, Hence, testing means comprising plural transducers or detectors, each of outputs are combined to produce only on indication is not classifiable in this subclass unless the whole test is automatically repeated.
SEE OR SEARCH THIS CLASS, SUBCLASS:
114, for plural tests employing plural meters, which tests are not automatically sequenced.
115+, for plural tests employing plural meter ranges, which tests are not automatically sequenced.
133, for plural go-no-go tests which are not automatically sequenced.
140, for testing means having plural inputs, which means does not include automatic sequencing.
459+, for measuring or testing electrical parameters of printed circuits with an ionizable gas.
500+, for plural tests explicitly for the purpose of detecting failures in circuits or circuit elements consisting of open or short circuits.
754+, for probes, per se, which might be suitable for use with subject matter of this subclass type.
SEE OR SEARCH CLASS
209, Classifying, Separating, and Assorting Solids, especially
556, for diverse electrical test used to classify, separate or sort articles, and subclasses 571+ for sorting by sensing properties of articles by electrical testing means. 250, Radiant Energy,
306+, for plural sequential tests involving testing by charged particles, especially subclass 310 for automatic sequential tests of printed circuits using an electron probe, and subclasses 363+ for automatic sequential tests of electrical circuits and devices using radiant energy and
invisible-to-visible light converters.
340, Communications: Electrical,
653, for electrical alarms responsive to circuits for testing electrical circuits or components.
382, Image Analysis, appropriate subclasses for automatic, sequential tests of printed circuits using image comparison.
455, Telecommunications,
115, and 226 for the testing of radio transmitters and receivers, respectively, which may include automatic sequential tests.
702, Data Processing: Measuring, Calibrating, or Testing,
108+, for testing systems, particularly subclasses 117+ for testing of circuits, subclass 118 for testing multiple circuits, and subclass 121 for multiple test instruments.
714, Error Detection/Correction and Fault Detection/Recovery, appropriate subclasses for error detection, correction, recovery or prevention in pulse code data or computers.
