US PATENT SUBCLASS 324 / 76.36
.~.~.~.~ With optics

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

76.11  DF  MEASURING, TESTING, OR SENSING ELECTRICITY, PER SE {46}
76.12  DF  .~ Analysis of complex waves {3}
76.19  DF  .~.~ Frequency spectrum analyzer {7}
77.11  DF  .~.~.~ Nonscanning {5}
76.36.~.~.~.~ With optics {1}
76.37  DF  .~.~.~.~.~> Bragg cell

DEFINITION

Classification: 324/76.36

With optics:

(under subclass 77.11) Subject matter comprising lenses, prisms, or mirrors to be used in the frequency spectrum analyzer.

SEE OR SEARCH CLASS

356, Optics: Measuring and Testing, for optics measuring and

testing, per se.

359, Optics: Systems (Including Communication) and Elements, appropriate subclasses for optical systems and devices that may be used in measuring and testing.