US PATENT SUBCLASS 324 / 76.12
.~ Analysis of complex waves

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

76.11  DF  MEASURING, TESTING, OR SENSING ELECTRICITY, PER SE {46}
76.12.~ Analysis of complex waves {3}
76.13  DF  .~.~> Amplitude distribution {5}
76.19  DF  .~.~> Frequency spectrum analyzer {7}
76.38  DF  .~.~> With sampler

DEFINITION

Classification: 324/76.12

Analysis of complex waves:

(under subclass 76.11) Subject matter whereby one or more components of a periodic wave made up of a combination of several frequencies or several sine waves superimposed on one another has components which are examined.

(1) Note. Such analysis as is found in this subclass is usually referred to as Fourier analysis.

SEE OR SEARCH THIS CLASS, SUBCLASS:

76.39+, for the measurement of frequency of a cyclic current or voltage, per se.

76.77+, for the measurement of phase of cyclic voltage or current.

SEE OR SEARCH CLASS

73, Measuring and Testing,

861.06, for volume or rate of flow meters measuring transit time of a tracer or tag by correlator means. 702, Data Processing: Measuring, Calibrating, or Testing,

66+, for wave form analysis, particularly subclass 77 for Fourier analysis, subclass 112 for a testing system having sinusoidal signal stimulus, and subclasses 124+ for signal generation or waveform shaping.

704, Data Processing: Speech Signal Processing, Linguistics, Language Translation, and Audio Compression/Decompression,

205+, for determination of the component frequencies in a speech signal.