US PATENT SUBCLASS 324 / 76.38
.~.~ With sampler


Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

76.11  DF  MEASURING, TESTING, OR SENSING ELECTRICITY, PER SE {46}
76.12  DF  .~ Analysis of complex waves {3}
76.38.~.~ With sampler


DEFINITION

Classification: 324/76.38

With sampler:

(under subclass 76.12) Subject matter including a device whose output is a series of discrete values representative of the values of an input at a series of points in time.

SEE OR SEARCH THIS CLASS, SUBCLASS:

76.15, for sampling in amplitude distribution devices.

76.24, for sampling in a frequency spectrum analyzer.

76.42, for sampling by frequency comparison in frequency of cyclic current or voltage.

76.58, for sampling in digital output by phase comparison.