US PATENT SUBCLASS 324 / 77.11
.~.~.~ Nonscanning

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

76.11  DF  MEASURING, TESTING, OR SENSING ELECTRICITY, PER SE {46}
76.12  DF  .~ Analysis of complex waves {3}
76.19  DF  .~.~ Frequency spectrum analyzer {7}
77.11.~.~.~ Nonscanning {5}
76.28  DF  .~.~.~.~> Digital filter
76.29  DF  .~.~.~.~> With filtering {1}
76.33  DF  .~.~.~.~> Correlation {1}
76.35  DF  .~.~.~.~> With delay line
76.36  DF  .~.~.~.~> With optics {1}

DEFINITION

Classification: 324/77.11

Nonscanning:

(under subclass 76.19) Subject matter wherein the frequency components of the spectrum are acquired simultaneously.