US PATENT SUBCLASS 324 / 262
.~ Magnetic test structure elements

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

200  DF  MAGNETIC {24}
262.~ Magnetic test structure elements

DEFINITION

Classification: 324/262

Magnetic test structure elements:

(under subclass 200) Subject matter which includes supports for tested material and sensing devices, and other elements not provided for elsewhere.

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158, for test fixtures and supports for sensors generally.

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174, Electricity: Conductors and Insulators, particularly

32+, for anti-inductive structures.

248, Supports, for holding devices for materials, particularly

2+, for machinery supports.