US PATENT SUBCLASS 324 / 655
.~.~.~ Including a tuned or resonant circuit

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

600  DF  IMPEDANCE, ADMITTANCE OR OTHER QUANTITIES REPRESENTATIVE OF ELECTRICAL STIMULUS/RESPONSE RELATIONSHIPS {8}
649  DF  .~ Lumped type parameters {6}
654  DF  .~.~ Using inductive type measurement {2}
655.~.~.~ Including a tuned or resonant circuit

DEFINITION

Classification: 324/655

Including a tuned or resonant circuit:

(under subclass 654) Subject matter including measuring or testing a circuit which contains both inductance and capacitance and is tuned to resonate at a certain frequency.

(1) Note. A resonant condition exists when an inductor and capacitor store energy and pass the same energy back and forth. The rate at which this occurs is called the resonant frequency. At the resonant frequency the circuit is neither inductive nor capacitive, but exhibits resistance.

SEE OR SEARCH THIS CLASS, SUBCLASS:

633+, for distributive type parameter measuring or testing utilizing resonant frequency determination.

652, for lumped type parameter measuring or testing by utilizing reactance or susceptance measurement which involves a resonant circuit.

668, 675, 682, and 708, for lumped type parameter measuring or testing which involves a resonant circuit.