US PATENT SUBCLASS 324 / 649
.~ Lumped type parameters

Current as of: June, 1999
Click HD for Main Headings
Click for All Classes

Internet Version by PATENTEC © 1999      Terms of Use


324 /   HD   ELECTRICITY: MEASURING AND TESTING

600  DF  IMPEDANCE, ADMITTANCE OR OTHER QUANTITIES REPRESENTATIVE OF ELECTRICAL STIMULUS/RESPONSE RELATIONSHIPS {8}
649.~ Lumped type parameters {6}
650  DF  .~.~> Using phasor or vector analysis {1}
652  DF  .~.~> Of a resonant circuit
653  DF  .~.~> For figure of merit or Q value
654  DF  .~.~> Using inductive type measurement {2}
658  DF  .~.~> Using capacitive type measurement {10}
691  DF  .~.~> Using resistance or conductance measurement {12}

DEFINITION

Classification: 324/649

Lumped type parameters:

(under subclass 600) Subject matter including the measuring or testing of any circuit parameter, which for the purposes of analysis, can be considered to represent combined or single inductance, capacitance, resistance, etc., throughout the frequency range of interest.

(1) Note. Typically a "lumped" electrical parameter such as impedance is an impedance concentrated in a component, as distinct from being an impedance due to stray or distributed effects.