US PATENT SUBCLASS 324 / 691
.~.~ Using resistance or conductance measurement


Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

600  DF  IMPEDANCE, ADMITTANCE OR OTHER QUANTITIES REPRESENTATIVE OF ELECTRICAL STIMULUS/RESPONSE RELATIONSHIPS {8}
649  DF  .~ Lumped type parameters {6}
691.~.~ Using resistance or conductance measurement {12}
692  DF  .~.~.~> With living organism condition determination using conductivity effects
693  DF  .~.~.~> With object or substance characteristic determination using conductivity effects {5}
702  DF  .~.~.~> With radiant energy effects {1}
704  DF  .~.~.~> With ratio determination
705  DF  .~.~.~> With comparison or difference circuit {1}
707  DF  .~.~.~> With frequency response, change or processing circuit {1}
709  DF  .~.~.~> With phase signal processing circuit
710  DF  .~.~.~> With pulse signal processing circuit {2}
713  DF  .~.~.~> With voltage or current signal evaluation {2}
719  DF  .~.~.~> With semiconductor or IC materials quality determination using conductivity effects
720  DF  .~.~.~> With compensation means {1}
722  DF  .~.~.~> Device or apparatus determines conductivity effects {2}


DEFINITION

Classification: 324/691

Using resistance or conductance measurement:

(under subclass 649) Subject matter including measuring that property of an object which impedes current and results in the dissipation of power in the form of heat, or the property that is the factor by which the square of an instantaneous voltage must be multiplied to give the corresponding energy lost by dissipation as heat or other permanent radiation.

SEE OR SEARCH THIS CLASS, SUBCLASS:

439+, for using a conductivity device to determine electrolytic properties.

549, for detecting resistor faults.