US PATENT SUBCLASS 324 / 707
.~.~.~ With frequency response, change or processing circuit

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

600  DF  IMPEDANCE, ADMITTANCE OR OTHER QUANTITIES REPRESENTATIVE OF ELECTRICAL STIMULUS/RESPONSE RELATIONSHIPS {8}
649  DF  .~ Lumped type parameters {6}
691  DF  .~.~ Using resistance or conductance measurement {12}
707.~.~.~ With frequency response, change or processing circuit {1}
708  DF  .~.~.~.~> Including a tuned or resonant circuit

DEFINITION

Classification: 324/707

With frequency response, change or processing circuit:

(under subclass 691) Subject matter including circuit means to determine or alter a signal as a function of frequency.

SEE OR SEARCH THIS CLASS, SUBCLASS:

667+, for measuring or testing lumped type parameters by capacitive type measurements including dielectric characteristic measurement to determine water content of an object or material by using frequency signal response, change or processing circuitry.

674+, for measuring or testing lumped type parameters by capacitive type measurements utilizing frequency signal response, change or processing circuitry.

681+, for measuring or testing lumped type parameters by capacitive type measurements which include using frequency signal response, change or processing circuitry.