US PATENT SUBCLASS 324 / 600
IMPEDANCE, ADMITTANCE OR OTHER QUANTITIES REPRESENTATIVE OF ELECTRICAL STIMULUS/RESPONSE RELATIONSHIPS

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

600IMPEDANCE, ADMITTANCE OR OTHER QUANTITIES REPRESENTATIVE OF ELECTRICAL STIMULUS/RESPONSE RELATIONSHIPS {8}
601  DF  .~> Calibration
602  DF  .~> With auxiliary means to condition stimulus/response signals {3}
612  DF  .~> Parameter related to the reproduction or fidelity of a signal affected by a circuit under test {4}
629  DF  .~> Distributive type parameters {6}
649  DF  .~> Lumped type parameters {6}
725  DF  .~> Using a particular bridge circuit
726  DF  .~> Transformer testing (e.g., ratio)
727  DF  .~> Piezoelectric crystal testing (e.g., frequency, resistance)

DEFINITION

Classification: 324/600

IMPEDANCE, ADMITTANCE OR OTHER QUANTITIES REPRESENTATIVE OF ELECTRICAL STIMULUS/RESPONSE RELATIONSHIPS:

(under the class definition) Subject matter wherein the measurement or test means determines a property (parameter) defined by (1) the flow, storage or change of current value in a circuit or substance; or (2) the relationship between two or more electrical values in a circuit or substance.

(1) Note. The parameter represents typically the relationship between a stimulus and its response, and it usually is a constant at the time of measurement, but may take other values under different circumstances. The stimulus/response relationship frequently indicates the proportionality between two active electrical variable. For

instance, a resistance is a ratio between the voltage across and the current along a resistive element. Either the current or the voltage can be the stimulus with the resultant resistance value always equal to the ratio of voltage to current. Other parameters expressable as a ratio are, for instance, the reflection coefficient, a ratio between reflected and incident complex power. Parameters not expressable as a ratio are also covered. For instance, the time lag in a network is a time differential between a signal arrival at the input and its appearance at the output.

(2) Note. The subclass also includes sensing structures and devices when the contribute directly to the extraction of the parameter of interest.

(3) Note. This subclass also includes measurement conditions such as using radiant energy effects, for example heating, in preparation for making the test. For electric heating, see the search note below.

(4) Note. This subclass includes measuring temperature for the purpose of compensating for temperature variations during testing. For generic temperature measurement, see the Search Note below.

SEE OR SEARCH THIS CLASS, SUBCLASS:

76+, for measuring and testing relating to the measurement of intangible electrical voltage or current or combinations thereof occurring in a nonspecific environment. 459+, for electrical measuring and testing using ionization effects.

SEE OR SEARCH CLASS

219, Electric Heating, for electric heating.

374, Thermal Measuring and Testing, for generic temperature measurement.