US PATENT SUBCLASS 324 / 719
.~.~.~ With semiconductor or IC materials quality determination using conductivity effects

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

600  DF  IMPEDANCE, ADMITTANCE OR OTHER QUANTITIES REPRESENTATIVE OF ELECTRICAL STIMULUS/RESPONSE RELATIONSHIPS {8}
649  DF  .~ Lumped type parameters {6}
691  DF  .~.~ Using resistance or conductance measurement {12}
719.~.~.~ With semiconductor or IC materials quality determination using conductivity effects

DEFINITION

Classification: 324/719

With semiconductor or IC materials quality determination using conductivity effects:

(under subclass 691) Subject matter including means to evaluate the properties of semiconductor or integrated circuit material.

SEE OR SEARCH THIS CLASS, SUBCLASS:

500+, for fault testing of semiconductor devices.

765, for miscellaneous electrical transistor testing.

SEE OR SEARCH CLASS

324, Electricity: Measuring and Testing,

73, for automatic sequential tests of PC boards.

438, Semiconductor Device Manufacturing: Process,

17+, for methods of making semiconductor electrical devices combined with measurement of an electrical condition.

714, Error Detection/Correction and Fault Detection/Recovery,

724+, for determining faults in ICs by testing information content of signals.