US PATENT SUBCLASS 324 / 709
.~.~.~ With phase signal processing circuit

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

600  DF  IMPEDANCE, ADMITTANCE OR OTHER QUANTITIES REPRESENTATIVE OF ELECTRICAL STIMULUS/RESPONSE RELATIONSHIPS {8}
649  DF  .~ Lumped type parameters {6}
691  DF  .~.~ Using resistance or conductance measurement {12}
709.~.~.~ With phase signal processing circuit

DEFINITION

Classification: 324/709

With phase signal processing circuit:

(under subclass 691) Subject matter including circuit means responsive to the phase of an electrical signal.

SEE OR SEARCH THIS CLASS, SUBCLASS:

683, for measuring or testing lumped type parameters by capacitive measurements with phase signal evaluation.