US PATENT SUBCLASS 324 / 710
.~.~.~ With pulse signal processing circuit

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

600  DF  IMPEDANCE, ADMITTANCE OR OTHER QUANTITIES REPRESENTATIVE OF ELECTRICAL STIMULUS/RESPONSE RELATIONSHIPS {8}
649  DF  .~ Lumped type parameters {6}
691  DF  .~.~ Using resistance or conductance measurement {12}
710.~.~.~ With pulse signal processing circuit {2}
711  DF  .~.~.~.~> Including R/C time constant circuit
712  DF  .~.~.~.~> Including a digital or logic circuit

DEFINITION

Classification: 324/710

With pulse signal processing circuit:

(under subclass 691) Subject matter including circuit means to utilize electrical signal pulses and their time domain response or shaping.

SEE OR SEARCH THIS CLASS, SUBCLASS:

676+, for measuring or testing lumped type parameters by capacitive type measurement which includes pulse signal processing.