324 / | HD | ELECTRICITY: MEASURING AND TESTING |
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600 | DF | IMPEDANCE, ADMITTANCE OR OTHER QUANTITIES REPRESENTATIVE OF ELECTRICAL STIMULUS/RESPONSE RELATIONSHIPS {8} |
649 | DF | .~ Lumped type parameters {6} |
658 | | .~.~ Using capacitive type measurement {10} |
659 | DF | .~.~.~> With loss characteristic evaluation |
660 | DF | .~.~.~> With variable electrode area |
661 | DF | .~.~.~> With variable distance between capacitor electrodes {1} |
663 | DF | .~.~.~> Where a material or object forms part of the dielectric being measured {4} |
676 | DF | .~.~.~> With pulse signal processing circuit {2} |
679 | DF | .~.~.~> With comparison or difference circuit {1} |
681 | DF | .~.~.~> With frequency signal response, change or processing circuit {1} |
683 | DF | .~.~.~> With phase signal processing circuit |
684 | DF | .~.~.~> With compensation means {1} |
686 | DF | .~.~.~> With a capacitive sensing means {4} |