US PATENT SUBCLASS 324 / 663
.~.~.~ Where a material or object forms part of the dielectric being measured

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

600  DF  IMPEDANCE, ADMITTANCE OR OTHER QUANTITIES REPRESENTATIVE OF ELECTRICAL STIMULUS/RESPONSE RELATIONSHIPS {8}
649  DF  .~ Lumped type parameters {6}
658  DF  .~.~ Using capacitive type measurement {10}
663.~.~.~ Where a material or object forms part of the dielectric being measured {4}
664  DF  .~.~.~.~> To determine water content {3}
671  DF  .~.~.~.~> To determine dimension (e.g., dielectric thickness)
672  DF  .~.~.~.~> By comparison or difference circuit {1}
674  DF  .~.~.~.~> By frequency signal response, change or processing circuit {1}

DEFINITION

Classification: 324/663

Where a material or object forms part of the dielectric being measured:

(under subclass 658) Subject matter including measurement of the insulating material between the two plates of a capacitor.

SEE OR SEARCH CLASS

73, Measuring and Testing,

304, for using capacitance to measure level.