US PATENT SUBCLASS 324 / 671
.~.~.~.~ To determine dimension (e.g., dielectric thickness)

Current as of: June, 1999
Click HD for Main Headings
Click for All Classes

Internet Version by PATENTEC © 1999      Terms of Use


324 /   HD   ELECTRICITY: MEASURING AND TESTING

600  DF  IMPEDANCE, ADMITTANCE OR OTHER QUANTITIES REPRESENTATIVE OF ELECTRICAL STIMULUS/RESPONSE RELATIONSHIPS {8}
649  DF  .~ Lumped type parameters {6}
658  DF  .~.~ Using capacitive type measurement {10}
663  DF  .~.~.~ Where a material or object forms part of the dielectric being measured {4}
671.~.~.~.~ To determine dimension (e.g., dielectric thickness)

DEFINITION

Classification: 324/671

To determine dimension (e.g., dielectric thickness):

(under subclass 663) Subject matter wherein the physical characteristics of a dielectric object under test pertaining to its size or distance from a reference point are measured.

SEE OR SEARCH THIS CLASS, SUBCLASS:

635, for dimensional measurement by using resonant frequency

measurements at microwave frequencies.

644, for measuring a dimension using transmitted or reflected microwave energy distributions.

662, for dimensional measurement by using capacitive type measurements.

716, for dimensional measurement by using resistive or conductive type measurements.