US PATENT SUBCLASS 324 / 674
.~.~.~.~ By frequency signal response, change or processing circuit

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

600  DF  IMPEDANCE, ADMITTANCE OR OTHER QUANTITIES REPRESENTATIVE OF ELECTRICAL STIMULUS/RESPONSE RELATIONSHIPS {8}
649  DF  .~ Lumped type parameters {6}
658  DF  .~.~ Using capacitive type measurement {10}
663  DF  .~.~.~ Where a material or object forms part of the dielectric being measured {4}
674.~.~.~.~ By frequency signal response, change or processing circuit {1}
675  DF  .~.~.~.~.~> Including a tuned or resonant circuit

DEFINITION

Classification: 324/674

By frequency signal response, change or processing circuit:

(under subclass 663) Subject matter including circuit means to determine or alter a signal as a function of frequency.

SEE OR SEARCH THIS CLASS, SUBCLASS:

605, for measuring or testing electrical characteristics or parameters using a particular technique for frequency signal evaluation or processing.

667+, for measuring or testing lumped type parameters by capacitive type measurements including dielectric characteristic measurement to determine water content of an object or material by using frequency signal response, change or processing circuitry.

681+, for measuring or testing lumped type parameters by capacitive type measurements using frequency signal response, change or processing circuitry.

707+, for measuring or testing lumped type parameters by resistive or conductive type measurements using frequency signal response, change or processing circuitry.