US PATENT SUBCLASS 324 / 672
.~.~.~.~ By comparison or difference circuit

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

600  DF  IMPEDANCE, ADMITTANCE OR OTHER QUANTITIES REPRESENTATIVE OF ELECTRICAL STIMULUS/RESPONSE RELATIONSHIPS {8}
649  DF  .~ Lumped type parameters {6}
658  DF  .~.~ Using capacitive type measurement {10}
663  DF  .~.~.~ Where a material or object forms part of the dielectric being measured {4}
672.~.~.~.~ By comparison or difference circuit {1}
673  DF  .~.~.~.~.~> Including a bridge circuit

DEFINITION

Classification: 324/672

By comparison or difference circuit:

(under subclass 663) Subject matter including means to match two or more electrical quantities for the purpose of determining their relative values in evaluating the dielectric characteristic of a material or object.

SEE OR SEARCH THIS CLASS, SUBCLASS:

606, for signal evaluation or processing including comparison or difference techniques.

647+, for measuring distributive type parameters by utilizing comparison or difference circuits.

656+, for measuring lumped type parameters by inductive type measurements including comparison or difference circuits.

655+, for measuring lumped type parameters of an object or material including its dielectric characteristic by utilizing comparison or difference circuits.

679+, for measuring lumped type parameters by capacitive type measurement circuitry including a comparison of difference circuit.

705+, for measuring lumped type parameters by resistive or conductive type measurement including comparison or difference circuits.