US PATENT SUBCLASS 324 / 676
.~.~.~ With pulse signal processing circuit

Current as of: June, 1999
Click HD for Main Headings
Click for All Classes

Internet Version by PATENTEC © 1999      Terms of Use


324 /   HD   ELECTRICITY: MEASURING AND TESTING

600  DF  IMPEDANCE, ADMITTANCE OR OTHER QUANTITIES REPRESENTATIVE OF ELECTRICAL STIMULUS/RESPONSE RELATIONSHIPS {8}
649  DF  .~ Lumped type parameters {6}
658  DF  .~.~ Using capacitive type measurement {10}
676.~.~.~ With pulse signal processing circuit {2}
677  DF  .~.~.~.~> Including R/C time constant circuit
678  DF  .~.~.~.~> Including charge or discharge cycle circuit

DEFINITION

Classification: 324/676

With pulse signal processing circuit:

(under subclass 658) Subject matter including circuit means utilizing a pulse signal time domain response or shaping.

SEE OR SEARCH THIS CLASS, SUBCLASS:

710+, for measuring or testing lumped type parameters using resistive or conductive type measurements which include pulse signal processing.