US PATENT SUBCLASS 324 / 684
.~.~.~ With compensation means

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

600  DF  IMPEDANCE, ADMITTANCE OR OTHER QUANTITIES REPRESENTATIVE OF ELECTRICAL STIMULUS/RESPONSE RELATIONSHIPS {8}
649  DF  .~ Lumped type parameters {6}
658  DF  .~.~ Using capacitive type measurement {10}
684.~.~.~ With compensation means {1}
685  DF  .~.~.~.~> For temperature variation

DEFINITION

Classification: 324/684

With compensation means:

(under subclass 658) Subject matter including means to offset errors or undesirable characteristics in the measurement or test apparatus or process.

SEE OR SEARCH THIS CLASS, SUBCLASS:

669+, for measuring or testing lumped type parameters by capacitive measurement apparatus or process including dielectric characteristic measurement of a material or object for water content and compensation means.

720+, for measuring or testing lumped type parameters by resistive or conductive measurement with compensation.