US PATENT SUBCLASS 324 / 685
.~.~.~.~ For temperature variation

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

600  DF  IMPEDANCE, ADMITTANCE OR OTHER QUANTITIES REPRESENTATIVE OF ELECTRICAL STIMULUS/RESPONSE RELATIONSHIPS {8}
649  DF  .~ Lumped type parameters {6}
658  DF  .~.~ Using capacitive type measurement {10}
684  DF  .~.~.~ With compensation means {1}
685.~.~.~.~ For temperature variation

DEFINITION

Classification: 324/685

For temperature variation:

(under subclass 684) Subject matter including means to offset effects caused by changes in the ambient temperature.

SEE OR SEARCH THIS CLASS, SUBCLASS:

670, for measuring or testing lumped type parameters by capacitive type measurement including dielectric characteristic measurement with compensation for temperature variations.

721, for measuring or testing lumped type parameters by resistive or conductive type measurement with compensation

for temperature variations.