US PATENT SUBCLASS 324 / 683
.~.~.~ With phase signal processing circuit

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

600  DF  IMPEDANCE, ADMITTANCE OR OTHER QUANTITIES REPRESENTATIVE OF ELECTRICAL STIMULUS/RESPONSE RELATIONSHIPS {8}
649  DF  .~ Lumped type parameters {6}
658  DF  .~.~ Using capacitive type measurement {10}
683.~.~.~ With phase signal processing circuit

DEFINITION

Classification: 324/683

With phase signal processing circuit:

(under subclass 658) Subject matter including circuit means responsive to the phase of an electrical signal.

(1) Note. When the phase sensitive detection is used to extract quadrature components and compose a phasor.

SEE OR SEARCH THIS CLASS, SUBCLASS:

650+, and 709, for measuring or testing lumped type parameters by resistance or conductance measurement using phase signal processing.