US PATENT SUBCLASS 324 / 621
.~.~.~ Envelope delay

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

600  DF  IMPEDANCE, ADMITTANCE OR OTHER QUANTITIES REPRESENTATIVE OF ELECTRICAL STIMULUS/RESPONSE RELATIONSHIPS {8}
612  DF  .~ Parameter related to the reproduction or fidelity of a signal affected by a circuit under test {4}
620  DF  .~.~ Distortion {6}
621.~.~.~ Envelope delay

DEFINITION

Classification: 324/621

Envelope delay:

(under subclass 620) Subject matter including measuring or testing the rate of change of phase shift with respect to frequency.

(1) Note. The departure from a straight line defines the lack of uniformity in the delay for different frequencies.