US PATENT SUBCLASS 324 / 620
.~.~ Distortion

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

600  DF  IMPEDANCE, ADMITTANCE OR OTHER QUANTITIES REPRESENTATIVE OF ELECTRICAL STIMULUS/RESPONSE RELATIONSHIPS {8}
612  DF  .~ Parameter related to the reproduction or fidelity of a signal affected by a circuit under test {4}
620.~.~ Distortion {6}
621  DF  .~.~.~> Envelope delay
622  DF  .~.~.~> Phase
623  DF  .~.~.~> Harmonic
624  DF  .~.~.~> Intermodulation
625  DF  .~.~.~> Dissymmetry or asymmetry
626  DF  .~.~.~> Nonlinearity

DEFINITION

Classification: 324/620

Distortion:

(under subclass 612) Subject matter including measuring or testing for undesired changes in the waveform of a signal being evaluated.

(1) Note. Distortion is different from noise in that the effects are in general predictable as opposed to noise, where there is no set pattern.

SEE OR SEARCH CLASS

327, Miscellaneous Active Electrical Nonlinear Devices, Circuits, and Systems,

551+, for unwanted signal suppression.

455, Telecommunications,

63, 295+, and 501 for distortion prevention or reduction systems.