US PATENT SUBCLASS 324 / 76.27
.~.~.~.~ With particular sweep circuit

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

76.11  DF  MEASURING, TESTING, OR SENSING ELECTRICITY, PER SE {46}
76.12  DF  .~ Analysis of complex waves {3}
76.19  DF  .~.~ Frequency spectrum analyzer {7}
76.26  DF  .~.~.~ Scanning-panoramic receiver {1}
76.27.~.~.~.~ With particular sweep circuit

DEFINITION

Classification: 324/76.27

With particular sweep circuit:

(under subclass 76.26) Subject matter including a specific circuit which produces at regular intervals, an approximately linear, circular, or other movement of a beam in a cathode-ray tube.