US PATENT SUBCLASS 324 / 237
.~.~.~.~ Material flaw testing

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

200  DF  MAGNETIC {24}
228  DF  .~ With means to create magnetic field to test material {5}
234  DF  .~.~ Electrically energized nonforce type sensor {3}
236  DF  .~.~.~ Oscillator type {1}
237.~.~.~.~ Material flaw testing

DEFINITION

Classification: 324/237

Material flaw testing:

(under subclass 236) Subject matter wherein the material is magnetically tested for defects in the material.