US PATENT SUBCLASS 324 / 228
.~ With means to create magnetic field to test material

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

200  DF  MAGNETIC {24}
228.~ With means to create magnetic field to test material {5}
229  DF  .~.~> Thickness measuring {2}
232  DF  .~.~> Plural magnetic fields in material
233  DF  .~.~> With phase sensitive element
234  DF  .~.~> Electrically energized nonforce type sensor {3}
239  DF  .~.~> Induced voltage-type sensor {2}

DEFINITION

Classification: 324/228

With means to create magnetic field to test material:

(under subclass 200) Subject matter which includes structure to form a magnetic field for testing material, the apparatus

to sense and indicate the sensing of the magnetic field being responsive to the field as modified by the material tested.