US PATENT SUBCLASS 324 / 757
.~.~.~ Probe contact enhancement

Current as of: June, 1999
Click HD for Main Headings
Click for All Classes

Internet Version by PATENTEC © 1999      Terms of Use


324 /   HD   ELECTRICITY: MEASURING AND TESTING

500  DF  FAULT DETECTING IN ELECTRIC CIRCUITS AND OF ELECTRIC COMPONENTS {10}
537  DF  .~ Of individual circuit component or element {17}
754  DF  .~.~ With probe elements {8}
757.~.~.~ Probe contact enhancement

DEFINITION

Classification: 324/757

Probe contact enhancement:

(under subclass 754) Subject matter including a feature for aiding the probe to make proper contact.