US PATENT SUBCLASS 324 / 754
.~.~ With probe elements

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

500  DF  FAULT DETECTING IN ELECTRIC CIRCUITS AND OF ELECTRIC COMPONENTS {10}
537  DF  .~ Of individual circuit component or element {17}
754.~.~ With probe elements {8}
755  DF  .~.~.~> Internal of or on support for device under test (DUT)
756  DF  .~.~.~> Contact confirmation
757  DF  .~.~.~> Probe contact enhancement
758  DF  .~.~.~> Probe alignment or positioning
759  DF  .~.~.~> With recording of test results on DUT
760  DF  .~.~.~> With temperature control
761  DF  .~.~.~> Pin
762  DF  .~.~.~> Cantilever

DEFINITION

Classification: 324/754

With probe elements:

(under subclass 537) Subject matter including a feature to enable contact between a device under test (DUT) and a test apparatus.