US PATENT SUBCLASS 324 / 762
.~.~.~ Cantilever

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

500  DF  FAULT DETECTING IN ELECTRIC CIRCUITS AND OF ELECTRIC COMPONENTS {10}
537  DF  .~ Of individual circuit component or element {17}
754  DF  .~.~ With probe elements {8}
762.~.~.~ Cantilever

DEFINITION

Classification: 324/762

Cantilever:

(under subclass 754) Subject matter including a probe element set at a first end of a beam wherein the beam has a first end and a second end and the second end is attached to a support.