US PATENT SUBCLASS 324 / 537
.~ Of individual circuit component or element

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

500  DF  FAULT DETECTING IN ELECTRIC CIRCUITS AND OF ELECTRIC COMPONENTS {10}
537.~ Of individual circuit component or element {17}
750  DF  .~.~> System sensing fields adjacent device under test (DUT) {3}
754  DF  .~.~> With probe elements {8}
763  DF  .~.~> DUT including test circuit
764  DF  .~.~> With identification of DUT
765  DF  .~.~> Test of semiconductor device {1}
770  DF  .~.~> Liquid crystal device test
771  DF  .~.~> Power supply test
772  DF  .~.~> Motor or generator fault tests
538  DF  .~.~> Electrical connectors
539  DF  .~.~> Multiconductor cable {3}
543  DF  .~.~> Single conductor cable {1}
545  DF  .~.~> Armature or rotor
546  DF  .~.~> Winding or coil {1}
548  DF  .~.~> Capacitor
549  DF  .~.~> Resistor
550  DF  .~.~> Fuse
551  DF  .~.~> Insulation {3}

DEFINITION

Classification: 324/537

Of individual circuit component or element:

(under subclass 500) Subject matter relating to the detection of the presence or absence of a defect in an electric component, or element, by giving a nonquantitative indication thereof.

(1) Note. This subclass includes a circuit, or an instrument, which is used to test the particular component or element.

SEE OR SEARCH THIS CLASS, SUBCLASS:

71, for testing semiconductors for a nonelectrical property.

378+, for testing internal combustion engine ignition testing.

403+, for testing lamp or discharge devices.

415+, for testing switching devices.

425+, for battery testing. SEE OR SEARCH CLASS

340, Communications: Electrical,

635+, for monitoring the condition of electric components and elements.