US PATENT SUBCLASS 324 / 765
.~.~ Test of semiconductor device

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

500  DF  FAULT DETECTING IN ELECTRIC CIRCUITS AND OF ELECTRIC COMPONENTS {10}
537  DF  .~ Of individual circuit component or element {17}
765.~.~ Test of semiconductor device {1}
766  DF  .~.~.~> With barrier layer {3}

DEFINITION

Classification: 324/765

Test of semiconductor device:

(under subclass 537) Subject matter including a determination of faults in a material which is a solid or liquid conductor with resistivity between that of metals and that of insulators.

SEE OR SEARCH CLASS

438, Semiconductor Device Manufacturing: Process,

17+, for methods of making semiconductor electrical devices combined with measurement of an electrical condition.