US PATENT SUBCLASS 324 / 766
.~.~.~ With barrier layer

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

500  DF  FAULT DETECTING IN ELECTRIC CIRCUITS AND OF ELECTRIC COMPONENTS {10}
537  DF  .~ Of individual circuit component or element {17}
765  DF  .~.~ Test of semiconductor device {1}
766.~.~.~ With barrier layer {3}
767  DF  .~.~.~.~> Diode
768  DF  .~.~.~.~> Bipolar transistor
769  DF  .~.~.~.~> Field effect transistor

DEFINITION

Classification: 324/766

With barrier layer:

(under subclass 765) Subject matter having a region in which the mobile-carrier charge density is insufficient to neutralize the net fixed charge density of donors and acceptors.