US PATENT SUBCLASS 324 / 767
.~.~.~.~ Diode

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

500  DF  FAULT DETECTING IN ELECTRIC CIRCUITS AND OF ELECTRIC COMPONENTS {10}
537  DF  .~ Of individual circuit component or element {17}
765  DF  .~.~ Test of semiconductor device {1}
766  DF  .~.~.~ With barrier layer {3}
767.~.~.~.~ Diode

DEFINITION

Classification: 324/767

Diode:

(under subclass 766) Subject matter including a two electrode (anode and cathode), single junction (PN) semiconductor device used as an active switching element responsive to

respective input logic signals to perform the logic function.