.~ Of individual circuit component or element {17}
763
.~.~ DUT including test circuit
DEFINITION
Classification: 324/763
DUT including test circuit:
(under subclass 537) Subject matter wherein a device under test (DUT) has integral elements which can be manipulated to configure the DUT so that tests can be made.
(1) Note. For example, a pad of an IC may, by switching, be connected to enable testing of a part of the IC not normally available for testing.
SEE OR SEARCH CLASS
257, Active Solid-State Devices (e.g., Transistors, Solid-State Diodes),
