US PATENT SUBCLASS 324 / 763
.~.~ DUT including test circuit


Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

500  DF  FAULT DETECTING IN ELECTRIC CIRCUITS AND OF ELECTRIC COMPONENTS {10}
537  DF  .~ Of individual circuit component or element {17}
763.~.~ DUT including test circuit


DEFINITION

Classification: 324/763

DUT including test circuit:

(under subclass 537) Subject matter wherein a device under test (DUT) has integral elements which can be manipulated to configure the DUT so that tests can be made.

(1) Note. For example, a pad of an IC may, by switching, be connected to enable testing of a part of the IC not normally available for testing.

SEE OR SEARCH CLASS

257, Active Solid-State Devices (e.g., Transistors, Solid-State Diodes),

48, for test or calibration structure.