US PATENT SUBCLASS 324 / 750
.~.~ System sensing fields adjacent device under test (DUT)

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

500  DF  FAULT DETECTING IN ELECTRIC CIRCUITS AND OF ELECTRIC COMPONENTS {10}
537  DF  .~ Of individual circuit component or element {17}
750.~.~ System sensing fields adjacent device under test (DUT) {3}
751  DF  .~.~.~> Using electron beam probe
752  DF  .~.~.~> Using light probe
753  DF  .~.~.~> Using electro-optic device

DEFINITION

Classification: 324/750

System sensing fields adjacent device under test (DUT):

(under subclass 537) Subject matter for detecting faults by sensing an electromagnetic field produced by a device under test.