US PATENT SUBCLASS 324 / 751
.~.~.~ Using electron beam probe

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

500  DF  FAULT DETECTING IN ELECTRIC CIRCUITS AND OF ELECTRIC COMPONENTS {10}
537  DF  .~ Of individual circuit component or element {17}
750  DF  .~.~ System sensing fields adjacent device under test (DUT) {3}
751.~.~.~ Using electron beam probe

DEFINITION

Classification: 324/751

Using electron beam probe:

(under subclass 750) Subject matter wherein a cathode-ray device is used to sense the fields.