US PATENT SUBCLASS 324 / 770
.~.~ Liquid crystal device test
Current as of:
June, 1999
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324 /
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ELECTRICITY: MEASURING AND TESTING
500
DF
FAULT DETECTING IN ELECTRIC CIRCUITS AND OF ELECTRIC COMPONENTS
{10}
537
DF
.~ Of individual circuit component or element {17}
770
.~.~ Liquid crystal device test
DEFINITION
Classification: 324/770
Liquid crystal device test:
Subject matter under 537 including test of a device whose reflectance or transmittance properties change when an electric field is applied.
(1) Note. This subclass includes testing singular or plural LCD elements for electrical defects or faults.
(2) Note. Subject matter related to optical properties of an LCD array to produce an image is classified in elsewhere.
(3) Note. Subject matter related to measurement of optical
properties of LCD elements or systems is classified elsewhere.
(4) Note. Subject matter related to LCD elements and systems is classified elsewhere.
SEE OR SEARCH CLASS
345, Computer Graphics Processing, Operator Interface Processing, and Selective Visual Display Systems, 50, for liquid crystal elements.
349, Liquid Crystal Cells, Elements and Systems, appropriate subclasses for utilizing a liquid crystal device in general.
356, Optics: Measuring and Testing, appropriate subclasses for LCD fault detection and testing, per se.
