US PATENT SUBCLASS 324 / 760
.~.~.~ With temperature control

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

500  DF  FAULT DETECTING IN ELECTRIC CIRCUITS AND OF ELECTRIC COMPONENTS {10}
537  DF  .~ Of individual circuit component or element {17}
754  DF  .~.~ With probe elements {8}
760.~.~.~ With temperature control

DEFINITION

Classification: 324/760

With temperature control:

(under subclass 754) Subject matter including means to

regulate temperature of the DUT or an apparatus used in testing.