US PATENT SUBCLASS 324 / 758
.~.~.~ Probe alignment or positioning

Current as of: June, 1999
Click HD for Main Headings
Click for All Classes

Internet Version by PATENTEC © 1999      Terms of Use


324 /   HD   ELECTRICITY: MEASURING AND TESTING

500  DF  FAULT DETECTING IN ELECTRIC CIRCUITS AND OF ELECTRIC COMPONENTS {10}
537  DF  .~ Of individual circuit component or element {17}
754  DF  .~.~ With probe elements {8}
758.~.~.~ Probe alignment or positioning

DEFINITION

Classification: 324/758

Probe alignment or positioning:

(under subclass 754) Subject matter including a feature for checking or providing for proper position of probes with respect to contact points on the DUT.

SEE OR SEARCH CLASS

356, Optics: Measuring and Testing,

399+, for optical alignment.