US PATENT SUBCLASS 324 / 755
.~.~.~ Internal of or on support for device under test (DUT)

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

500  DF  FAULT DETECTING IN ELECTRIC CIRCUITS AND OF ELECTRIC COMPONENTS {10}
537  DF  .~ Of individual circuit component or element {17}
754  DF  .~.~ With probe elements {8}
755.~.~.~ Internal of or on support for device under test (DUT)

DEFINITION

Classification: 324/755

Internal of or on support for device under test (DUT):

(under subclass 754) Subject matter including a support for the DUT and wherein probe elements are mounted in or on the support.