US PATENT SUBCLASS 324 / 761
.~.~.~ Pin

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

500  DF  FAULT DETECTING IN ELECTRIC CIRCUITS AND OF ELECTRIC COMPONENTS {10}
537  DF  .~ Of individual circuit component or element {17}
754  DF  .~.~ With probe elements {8}
761.~.~.~ Pin

DEFINITION

Classification: 324/761

Pin:

(under subclass 754) Subject matter wherein the probe element is a connecting device such as a spring biased rod or a buckling beam (rod).