US PATENT SUBCLASS 324 / 756
.~.~.~ Contact confirmation

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

500  DF  FAULT DETECTING IN ELECTRIC CIRCUITS AND OF ELECTRIC COMPONENTS {10}
537  DF  .~ Of individual circuit component or element {17}
754  DF  .~.~ With probe elements {8}
756.~.~.~ Contact confirmation

DEFINITION

Classification: 324/756

Contact confirmation:

(under subclass 754) Subject matter including a feature to enable determination whether proper probe contact has been made.