US PATENT SUBCLASS 324 / 667
.~.~.~.~.~ By frequency signal response, change or processing circuit

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

600  DF  IMPEDANCE, ADMITTANCE OR OTHER QUANTITIES REPRESENTATIVE OF ELECTRICAL STIMULUS/RESPONSE RELATIONSHIPS {8}
649  DF  .~ Lumped type parameters {6}
658  DF  .~.~ Using capacitive type measurement {10}
663  DF  .~.~.~ Where a material or object forms part of the dielectric being measured {4}
664  DF  .~.~.~.~ To determine water content {3}
667.~.~.~.~.~ By frequency signal response, change or processing circuit {1}
668  DF  .~.~.~.~.~.~> Including a tuned or resonant circuit

DEFINITION

Classification: 324/667

By frequency signal response, change or processing circuit:

(under subclass 664) Subject matter including circuit means to measure using a function of frequency signal.

SEE OR SEARCH THIS CLASS, SUBCLASS:

674+, for measuring or testing lumped type parameters by capacitive type measurements including dielectric characteristic measurements by using frequency signal response, change or processing circuitry.

681+, for measuring or testing lumped type parameters by capacitive type measurements using frequency signal response, change or processing circuitry.

707+, for measuring or testing lumped type parameters by resistive or conductive type measurements using frequency signal response, change or processing circuitry.