US PATENT SUBCLASS 324 / 668
.~.~.~.~.~.~ Including a tuned or resonant circuit

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

600  DF  IMPEDANCE, ADMITTANCE OR OTHER QUANTITIES REPRESENTATIVE OF ELECTRICAL STIMULUS/RESPONSE RELATIONSHIPS {8}
649  DF  .~ Lumped type parameters {6}
658  DF  .~.~ Using capacitive type measurement {10}
663  DF  .~.~.~ Where a material or object forms part of the dielectric being measured {4}
664  DF  .~.~.~.~ To determine water content {3}
667  DF  .~.~.~.~.~ By frequency signal response, change or processing circuit {1}
668.~.~.~.~.~.~ Including a tuned or resonant circuit

DEFINITION

Classification: 324/668

Including a tuned or resonant circuit:

(under subclass 667) Subject matter including a circuit which typically contains both inductance and capacitance and is tuned to resonate at a certain frequency.

(1) Note. A resonant condition exists when an inductor and capacitor store energy and pass the same energy back and forth. The rate at which this occurs is called the resonant frequency. At the resonant frequency the circuit is neither inductive nor capacitive, but exhibits resistance.

SEE OR SEARCH THIS CLASS, SUBCLASS:

633+, for distributive type parameter measuring or testing utilizing resonant frequency determination.

652, for lumped type parameter measuring or testing by

utilizing reactance or susceptance measurement which involves a resonant circuit.

655, 675, 682, and 708, for lumped type parameter measuring or testing which involves a resonant circuit.