US PATENT SUBCLASS 324 / 309
.~.~ To obtain localized resonance within a sample

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

300  DF  PARTICLE PRECESSION RESONANCE {7}
307  DF  .~ Using a nuclear resonance spectrometer system {8}
309.~.~ To obtain localized resonance within a sample

DEFINITION

Classification: 324/309

To obtain localized resonance within a sample:

(under subclass 307) Subject matter in which a measurement of nuclear magnetic resonance at controlled locations within a sample volume is obtained.