US PATENT SUBCLASS 324 / 637
.~.~ Using transmitted or reflected microwaves

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

600  DF  IMPEDANCE, ADMITTANCE OR OTHER QUANTITIES REPRESENTATIVE OF ELECTRICAL STIMULUS/RESPONSE RELATIONSHIPS {8}
629  DF  .~ Distributive type parameters {6}
637.~.~ Using transmitted or reflected microwaves {3}
638  DF  .~.~.~> Scattering type parameters (e.g., complex reflection coefficient)
639  DF  .~.~.~> Where energy is transmitted through a test substance {2}
642  DF  .~.~.~> Where energy is reflected (e.g., reflectometry) {4}

DEFINITION

Classification: 324/637

Using transmitted or reflected microwaves:

(under subclass 629) Subject matter wherein distributive type parameters associated with an object or substance are measured or tested using transmitted or returned microwaves.

(1) Note. See Class 250, Radiant Energy, for microwave absorption wave meters for measuring microwave power, per se.

SEE OR SEARCH CLASS

342, Communications: Directive Radio Wave Systems and Devices (e.g., Radar, Radio Navigation), for object detection, distance or direction using transmitted or reflected radio waves.