US PATENT SUBCLASS 324 / 642
.~.~.~ Where energy is reflected (e.g., reflectometry)

Current as of: June, 1999
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324 /   HD   ELECTRICITY: MEASURING AND TESTING

600  DF  IMPEDANCE, ADMITTANCE OR OTHER QUANTITIES REPRESENTATIVE OF ELECTRICAL STIMULUS/RESPONSE RELATIONSHIPS {8}
629  DF  .~ Distributive type parameters {6}
637  DF  .~.~ Using transmitted or reflected microwaves {3}
642.~.~.~ Where energy is reflected (e.g., reflectometry) {4}
643  DF  .~.~.~.~> To determine water content
644  DF  .~.~.~.~> To determine dimension (e.g., distance or thickness)
645  DF  .~.~.~.~> Having standing wave pattern
646  DF  .~.~.~.~> To determine reflection coefficient

DEFINITION

Classification: 324/642

Where energy is reflected (e.g., reflectometry):

(under subclass 637) Subject matter including measurement of the returned signal energy from a high frequency wave that strikes the surface of a test object, the junction of two media or a discontinuity in the medium it is traveling in.